The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Aug. 03, 2007
Applicants:

Christopher E. Stanek, Willoughby, OH (US);

Jiao Wang, Mayfield Heights, OH (US);

Fabio Malaspina, Twinsburg, OH (US);

Michael Silvestro, Twinsburg, OH (US);

Matthew Robert Ericsson, Lyndhurst, OH (US);

Inventors:

Christopher E. Stanek, Willoughby, OH (US);

Jiao Wang, Mayfield Heights, OH (US);

Fabio Malaspina, Twinsburg, OH (US);

Michael Silvestro, Twinsburg, OH (US);

Matthew Robert Ericsson, Lyndhurst, OH (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methodologies for viewing locations of a data point within a system are provided. A system provided herein includes a locate component that determines locations of a selected data point and a display component that displays the locations of the selected data point in a location structure, which can be displayed at a common area of display with the selected data point. In addition, a system provided herein further includes a navigation component that receives the locations of the selected data point and facilitates navigation of the area of display to a location selected from the location structure.


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