The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Oct. 31, 2011
Applicants:

Samy Makar, Fremont, CA (US);

Anuja Banerjee, San Jose, CA (US);

Inventors:

Samy Makar, Fremont, CA (US);

Anuja Banerjee, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for dynamic scan chain grouping is disclosed. In one embodiment, an integrated circuit (IC) includes a number of scan partitions. Each scan partition includes a number of scan input ports and a number of corresponding scan output ports. Each scan input port and each scan output port includes a number of scan paths. Additionally, each scan partition includes a number of scan chains. Each scan partition is programmable to couple the scan paths of one of the scan input ports to each of the scan chains. Similarly, the corresponding output port may also be coupled to the scan chains. The scan paths of the remaining scan input ports may be selected to bypass the scan chains of the scan partition, having their respective scan input ports connected directly to their respective scan output ports. Each scan partition may be reconfigurable.


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