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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8301431 B1

PDFFull Text
Date of Patent:
Oct. 30, 2012

Filed:

Dec. 30, 2008

Apparatus and method for accelerating simulations and designing integrated circuits and other systems

Applicants:

Keerthinarayan P. Heragu, Richardson, TX (US);

Theodore W. Houston, Richardson, TX (US);

Anand Seshadri, Richardson, TX (US);

Hugh T. Mair, Fairview, TX (US);

Inventors:

Keerthinarayan P. Heragu, Richardson, TX (US);

Theodore W. Houston, Richardson, TX (US);

Anand Seshadri, Richardson, TX (US);

Hugh T. Mair, Fairview, TX (US);

Assignee:

Texas Instruments Incorporated, Dallas, TX (US);

Attorneys:

Rose Alyssa Keagy

Wade J. Brady, III

Frederick J. Telecky, Jr.

Primary Examiner:

Eunhee Kim

Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of accelerating a Monte Carlo (MC) simulation for a system including a first component having a first input parameter and a second component having a second input parameter. The simulation model provided includes a first component model including a first model parameter corresponding to the first input parameter and a second component model having a second model parameter corresponding to the second input parameter. A first acceleration factor for the first component and a second acceleration factor for the second component are calculated based on at least the respective number of instances. A first scaled distribution is computed from the first distribution and a second scaled distribution is computed from the second distribution based on the respective acceleration factors. The MC simulation for the system is run, wherein values for the first model parameter value and second model parameter value are obtained based on the respective scaled distributions.

Find Patent Forward Citations

Heragu, Keerthinarayan. (2012). Apparatus and method for accelerating simulations and designing integrated circuits and other systems (U.S. Patent No. 8301431). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8301431

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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