The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

May. 27, 2009
Applicants:

Shunsuke Ono, Kakamigahara, JP;

Shigeki Watanabe, Kawasaki, JP;

Inventors:

Shunsuke Ono, Kakamigahara, JP;

Shigeki Watanabe, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A method is for calculating an optical noise index of a signal light extraction apparatus that extracts signal light in a polarization plane by inputting signal light and a sampling pulse, different from the signal light in polarization plane by a given angle, to a nonlinear optical medium, and by passing light output from the nonlinear optical medium through an orthogonal polarizer having a polarization plane orthogonal to that of the signal light. The method includes calculating an output optical noise of the signal light extraction apparatus using a parametric gain of the nonlinear optical medium, a power of a quantum noise of the light having passed through the orthogonal polarizer, and a ratio of a power of the signal light and a power of the signal light sampled by the sampling pulse; and calculating an optical noise index using the output optical noise.


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