The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Jun. 22, 2010
François Gutty, Ville, FR;
Schwartz Sylvain, Saint-Remy les Chevreuse, FR;
Jean-paul Pocholle, La Norville, FR;
Gilles Feugnet, Palaiseau, FR;
François Gutty, Ville, FR;
Schwartz Sylvain, Saint-Remy les Chevreuse, FR;
Jean-Paul Pocholle, La Norville, FR;
Gilles Feugnet, Palaiseau, FR;
Thales, Neuilly sur Seine, FR;
Abstract
Solid-state gyrolaser having a device for stabilizing the intensities making it possible to maintain equilibrium of the two counter-propagating modes having at least a means for calculating a rotation measurement (Ω, IΩ) of the gyrolaser on the basis of the counter-propagating modes having a frequency difference (Δνmes) between them, by assuming that the frequency difference (Δνmes) between the two counter-propagating modes is induced only by the rotation of the cavity. The gyrolaser also includes a means for measuring the control command (Co), a means for storing a behavior model (Mo) of a frequency bias (Δνb) induced by the device for stabilizing the intensities, as a function of the control command, a means for calculating the frequency bias (Δνb) induced by the device for stabilizing the intensities, on the basis of the value of the control command (Co) and the model (Mo), a means for calculating the bias (ΔΩb, ΔIΩb) in the rotation measurement (Ω, IΩ), induced by the frequency bias (Δνb), and a means for compensating for the bias (ΔΩb, ΔIΩb) in the rotation measurement (Ω, IΩ).