The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Apr. 02, 2008
Shawn J. Beard, Livermore, CA (US);
Xinlin Qing, Cupertino, CA (US);
Tom Chang, Mountain View, CA (US);
Lien Ouyang, Los Altos, CA (US);
Shawn J. Beard, Livermore, CA (US);
Xinlin Qing, Cupertino, CA (US);
Tom Chang, Mountain View, CA (US);
Lien Ouyang, Los Altos, CA (US);
Acellent Technologies, Inc., Sunnyvale, CA (US);
Abstract
A method for determining optimal locations of a plurality of sensors for damage detection in a structural health monitoring system includes providing a one or more signal performance characteristics, spatial parameters describing a layout of a structure, and generating a layout for the plurality of sensors according to the signal performance characteristics and the spatial parameters. An estimated largest critical damage size that may not be detected by sensors arranged according to the first layout is determined. The layout is edited so as to reduce the estimated largest critical damage size to be less than or equal to a selected maximum size requirement.