The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Aug. 05, 2010
Stanislav Wilhelm Forgang, Houston, TX (US);
Randy Gold, Houston, TX (US);
Zhiyong Jiang, Pearland, TX (US);
Carlos A. Yanzig, Houston, TX (US);
Stanislav Wilhelm Forgang, Houston, TX (US);
Randy Gold, Houston, TX (US);
Zhiyong Jiang, Pearland, TX (US);
Carlos A. Yanzig, Houston, TX (US);
Baker Hughes Incorporated, Houston, TX (US);
Abstract
A method for correcting a measurement of a property of a subsurface material includes: selecting an instrument that includes a test circuit and a separate sensor, the test circuit configured for providing a standard for referencing to generate correction information, the sensor configured for: transmitting an electric signal into the subsurface material; and receiving a data signal from the subsurface material; wherein the test circuit and the sensor are switchably coupled to an electronics unit of the instrument; receiving the electric signal from the test circuit in the electronics unit; using the electronics unit, measuring at least one output characteristic of the instrument; and applying the correction information to the data signal according to the measured output characteristic.