The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Apr. 02, 2010
Kei Nara, Yokohama, JP;
Tomohide Hamada, Yokohama, JP;
Kei Nara, Yokohama, JP;
Tomohide Hamada, Yokohama, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A defect detecting method of a display device includes a defect counting process that measuring a feature amount for each partial region of a display device (P), and counting regions which is determined as a defective portion based on the measured feature amount of the region (P), a process that stopping a manufacturing line of the display device when a number of defects counted at the defect counting process is greater than a first threshold value (P, P), a defect density calculating process that calculating a defect density in a predetermined area when the number of defects counted at the defect counting process is smaller than the first threshold value (P), and a process that stopping the manufacturing line of the display device when the defect density calculated at the defect density calculating process is higher than a second threshold value (P, P).