The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Dec. 25, 2008
Chih-kuang Chang, Taipei Hsien, TW;
Xian-yi Chen, Shenzhen, CN;
Zhong-kui Yuan, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Chih-Kuang Chang, Taipei Hsien, TW;
Xian-Yi Chen, Shenzhen, CN;
Zhong-Kui Yuan, Shenzhen, CN;
Li Jiang, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A computer-implemented method for adjusting backlight in measurement of a profile image of an object includes setting a light source of an image measuring machine to an original intensity level, obtaining the profile image of the object laid on the image measuring machine, and performing a mean filter processing and a binary image processing on the profile image. The method further includes setting intensity variables to adjust backlight intensity of the light source, uses the intensity variables to calculate an optimum intensity level of the backlight intensity utilizing an iterative method, and adjusting the backlight intensity of the light source to the optimum intensity level to obtain an optimum profile image of the object.