The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Mar. 11, 2008
Ryo Yamada, Kyoto, JP;
Itaru Furukawa, Kyoto, JP;
Kiyoshi Kitamura, Kyoto, JP;
Kazuhiro Nakai, Kyoto, JP;
Ryo Yamada, Kyoto, JP;
Itaru Furukawa, Kyoto, JP;
Kiyoshi Kitamura, Kyoto, JP;
Kazuhiro Nakai, Kyoto, JP;
Abstract
Input CAD data and run-length data obtained by performing a RIP process on the input CAD data are acquired. A predetermined conversion process is performed on at least one of the input CAD data and the run-length data to make the data formats of both data comparable and then both data are compared with each other to detect an area having a difference as a defect area in the run-length data. This provides a technique to detect a defect in the run-length data to be used for drawing of a figure before the execution of drawing with a simple structure.