The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Jul. 18, 2008
Tai Pang Chen, Singapore, SG;
Wei Yun Yau, Singapore, SG;
Tai Pang Chen, Singapore, SG;
Wei Yun Yau, Singapore, SG;
Agency for Science, Technology and Research, Singapore, SG;
Abstract
Embodiment of the invention provide a method and a device for determining a similarity value between a first template and a second template. A first cluster characteristic for each first cluster of a plurality of first clusters is determined, wherein each first cluster includes a plurality of first minutiae comprised in the first minutiae template. A second cluster characteristic for each second cluster of a plurality of second clusters is determined, wherein each second cluster includes a plurality of second minutiae comprised in the second minutiae template. The similarity value between the first minutiae template and the second minutiae template is determined based on the first cluster characteristics and the second cluster characteristics.