The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Jul. 22, 2010
Applicant:
Daniel Shedlock, Knoxville, TN (US);
Inventor:
Daniel Shedlock, Knoxville, TN (US);
Assignee:
Nucsafe, Inc., Oak Ridge, TN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for scanning an object in an inspection space are disclosed. The systems and methods generally incorporate spatially separated and sequenced Compton x-ray backscatter imaging techniques in a plurality of perspective planes. Such processes as time-gating detectors, weighting scintillation detections, and preferentially accepting signals that originate from a point that is substantially orthogonal to a radiation detector and at least partially shielding out signals that do not originate from a point substantially orthogonal to the detector may be used to enhance the data acquisition process.