The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Jul. 07, 2011
Dumitru Mihai Ionescu, San Diego, CA (US);
Abu Amanullah, San Diego, CA (US);
Ghobad Heidari-bateni, San Diego, CA (US);
Dumitru Mihai Ionescu, San Diego, CA (US);
Abu Amanullah, San Diego, CA (US);
Ghobad Heidari-Bateni, San Diego, CA (US);
Olympus Corporation, Hachioji-Shi, Tokyo, JP;
Abstract
Various embodiments of the systems and methods described herein may be used to compute a minimum variance unbiased estimator by receiving a first OFDM signal at a pilot tone, receiving a second OFDM signal sent in the same frequency band and determining a differential phase metric between the first OFDM signal and the second OFDM signal. In some embodiments, the differential phase metric may be used to diversity combine synchronization statistics. In various embodiments, the differential phase metric may be used to detect a narrow-band interference.