The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Mar. 28, 2011
Michael Haisch, Aalen, DE;
Christoph Hauger, Aalen, DE;
Harmut Wolf, Oberkochen, DE;
Joachim Hug, Oberkochen, DE;
Schwarz Brigitta, Oberkochen, DE;
Michael Haisch, Aalen, DE;
Christoph Hauger, Aalen, DE;
Harmut Wolf, Oberkochen, DE;
Joachim Hug, Oberkochen, DE;
Schwarz Brigitta, Oberkochen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Klinikum der Johann Wolfgang Goethe Universitaet Frankfurt, Frankfurt, DE;
Abstract
A microscopy system and method allow observing a fluorescent substance accumulated in a tissue. The tissue can be observed at a same time both with visible light and with fluorescent light. It is possible to observe a series of previously recorded fluorescent light images in superposition with the visible light images. An end of the series of images may be automatically determined. A thermal protective filter may be inserted into a beam path of an illuminating system at such automatically determined end of the series. Further, the fluorescent light image may be analyzed for identifying a coherent fluorescent portion thereof. A representation of a periphery line of the coherent portion may be generated, and depths profile data may be obtained only from the coherent portion. An illuminating light beam for exciting the fluorescence may be modulated for improving a contrast of fluorescent images.