The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Aug. 19, 2009
David G. Sansom, Chuluota, FL (US);
David B. Allen, Oviedo, FL (US);
Anirudha Vaidya, Oviedo, FL (US);
David G. Sansom, Chuluota, FL (US);
David B. Allen, Oviedo, FL (US);
Anirudha Vaidya, Oviedo, FL (US);
Siemens Energy, Inc., Orlando, FL (US);
Abstract
A method of measuring a thickness of a coating on a substrate material. A first pulse of monochromatic light having a predetermined first wavelength is emitted toward the coating and substrate material. A second pulse of monochromatic light having a predetermined second wavelength is emitted toward the coating and substrate material, the second wavelength being different than the first wavelength. A first elapsed time is measured from emission of the first pulse of light to reception of a reflection of the first pulse of light from a surface of the substrate material at an interface with the coating. A second elapsed time is measured from emission of the second pulse of light to reception of a reflection of the second pulse of light from an outer surface of the coating. A thickness of the coating is determined as a function of a difference between the first and second elapsed times.