The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8300230 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 30, 2012

Filed:

Oct. 15, 2007
Applicants:

Michael Galle, Grimsby, CA;

Waleed Mohammed, Nontaburi, TH;

LI Qian, Toronto, CA;

Inventors:

Michael Galle, Grimsby, CA;

Waleed Mohammed, Nontaburi, TH;

Li Qian, Toronto, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a three wave interference pattern and a single-arm interferometer Specifically the invention comprises a radiation source operable to emit radiation connected to an apparatus for separating incident and reflected waves; the apparatus for separating incident and reflected waves having an output arm adjacent to a first end of the waveguide; the apparatus for separating incident and reflected waves connected to a detector; a collimating apparatus positioned at a second end of the waveguide; and a reflecting apparatus positioned at a balanced distance from the collimating apparatus operable to reflect a test emission from the radiation source back through the collimating apparatus, the waveguide, and the apparatus for separating incident and reflected waves thereby generating an interference pattern that is recorded by the detector.


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Galle, Michael. (2012). System and method to determine chromatic dispersion in short lengths of waveguides using a 3-wave interference pattern and a single-arm interferometer (U.S. Patent No. 8300230). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8300230

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