The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Apr. 22, 2011
Applicants:

Ken Tsukii, Tokyo, JP;

Jie Xu, Tokyo, JP;

Kenichi Kimura, Tokyo, JP;

Inventors:

Ken Tsukii, Tokyo, JP;

Jie Xu, Tokyo, JP;

Kenichi Kimura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measurement apparatus can be provided, in which the sample is optically measured without loss of the illuminating light with high sensitivity. A glass plate as the transparent memberis placed in the interface between the end faceof the optical waveguideguiding the illuminating light L generated by the laser light sourceand the wall face of the capillary. According to the above feature, the air layer is prevented from existing in the interface between the end faceof the optical fiberand the wall face of the capillary, thus the sample S can be optically measured with high sensitivity and few variability without causing the loss of the illuminating light L.


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