The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Oct. 10, 2008
Toshihiko Kiwa, Okayama, JP;
Keiji Tsukada, Okayama, JP;
Toshihiko Kiwa, Okayama, JP;
Keiji Tsukada, Okayama, JP;
National Univeristy Corporation Okayama Univeristy, Okayama, JP;
Abstract
A material distribution measuring device () for measuring a reaction distribution or a concentration distribution of a material contained in a solution. The material distribution measuring device () comprises a material detecting plate () comprising a material-sensitive film () provided on an insulator () provided on a semiconductor (), a flow passage forming part () forming a solution flow passage () on the material detecting plate (), means for stabilizing the potential of the solution, means for applying a pulsed laser beam () from the semiconductor () side to the flow passage () side, means for scanning the material detecting plate () two-dimensionally with use of the pulsed laser beam (), means for measuring the amplitude strength of pulsed electromagnetic waves generated upon the application of the pulsed laser beam () to the material detecting plate (), and means for obtaining a reaction distribution or a concentration distribution of the material contained in the solution within the flow passage by qualitatively or quantitatively measuring the material to be detected from the amplitude strength.