The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Feb. 25, 2010
Applicants:

Anita M. Mahadevan-jansen, Nashville, TN (US);

David Dickensheets, Bozeman, MT (US);

Chad Lieber, Nashville, TN (US);

Inventors:

Anita M. Mahadevan-Jansen, Nashville, TN (US);

David Dickensheets, Bozeman, MT (US);

Chad Lieber, Nashville, TN (US);

Assignees:

Vanderbilt University, Nashville, TN (US);

Montana State University, Bozeman, MT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe using integrated confocal reflectance imaging, confocal Raman spectroscopy, and gross spatial imaging for non-invasiveIy evaluating a target of interest of a living subject. In one embodiment, the probe includes a casing with first and second ends, and first, second and third optical pons The firsi and second optical ports are located at the first end of the casing and the third optical port is located at the second end of the casing such that the first and third optical ports define a first optical path therebetween and the second and third optical ports define a second optical path therebetween, respectively. Each optical path has first and second portions, where the second portions of the first and second optical paths arc substantially overlapped and proximal to the third optical port.


Find Patent Forward Citations

Loading…