The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Aug. 10, 2010
Applicants:

Ki-yong OH, Daejeon, KR;

Joon-young Park, Daejeon, KR;

Jae-kyung Lee, Daejeon, KR;

Byung-hak Cho, Gwangju, KR;

Inventors:

Ki-Yong Oh, Daejeon, KR;

Joon-Young Park, Daejeon, KR;

Jae-Kyung Lee, Daejeon, KR;

Byung-Hak Cho, Gwangju, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nondestructive inspection method of testing insulators using frequency resonance function that can inspect an anomaly of an insulator by vibrating the insulator with a force having the characteristic of white noise, measuring the change in motion of the insulator according to the vibration and calculating the frequency resonance function of the insulator is disclosed.


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