The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Jun. 29, 2010
Marcos Kirsch, Austin, TX (US);
Marcos Kirsch, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A method of testing a relay set which includes mapping a relay set to an undirected graph indicative of a topology of the relay set and includes vertices indicative of channels of the relay set and edges extending between corresponding vertices indicative of relays. Values based on a characteristic of a relay of the relay set that corresponds to the respective edge of the undirected graph are stored. A plurality of candidate test paths for a relay-to-test that each connects a first input/output (I/O) channel and a second I/O channel, and includes the relay-to-test are identified. A total value for the edges of the candidate test paths is determined for each of the candidate test paths. The total values are compared to one another and a test path is determined for the relay-to-test based on the comparison.