The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

Jul. 16, 2009
Applicants:

Matthias Fenchel, Erlangen, DE;

Ralf Ladebeck, Erlangen, DE;

Christian J. Michel, Lenoir City, TN (US);

Charles C. Watson, Knoxville, TN (US);

Inventors:

Matthias Fenchel, Erlangen, DE;

Ralf Ladebeck, Erlangen, DE;

Christian J. Michel, Lenoir City, TN (US);

Charles C. Watson, Knoxville, TN (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Example embodiments are directed to a method of correcting attenuation in a magnetic resonance (MR) scanner and a positron emission tomography (PET) unit. The method includes acquiring PET sinogram data of an object within a field of view of the PET unit. The method further includes producing an attenuation map based on a maximum likelihood expectation maximization (MLEM) of a parameterized model instance and the PET sinogram data.


Find Patent Forward Citations

Quick Actions:

Fenchel, Matthias. (2012). Model based estimation of a complete or partial positron emission tomography attenuation map using maximum likelihood expectation maximization (U.S. Patent No. 8299438). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8299438

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…