The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Mar. 01, 2010
Mark A. Arbore, Los Altos, CA (US);
David L Klein, Palo Alto, CA (US);
Leonid A. Vasilyev, Beaverton, OR (US);
John M. Schmidt, Oakland, CA (US);
James E. Hudson, Portland, OR (US);
Gregory S. Horner, Felton, CA (US);
Mark A. Arbore, Los Altos, CA (US);
David L Klein, Palo Alto, CA (US);
Leonid A. Vasilyev, Beaverton, OR (US);
John M. Schmidt, Oakland, CA (US);
James E. Hudson, Portland, OR (US);
Gregory S. Horner, Felton, CA (US);
Tau Science Corporation, Felton, CA (US);
Abstract
The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.