The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2012

Filed:

May. 10, 2005
Applicants:

Yasumitsu Takagi, Kyoto, JP;

Hisakazu Sugie, Kyoto, JP;

Toshiyuki Otsuki, Kyoto, JP;

Norimasa Nishida, Kyoto, JP;

Yoshikiyo Hongo, Kyoto, JP;

Inventors:

Yasumitsu Takagi, Kyoto, JP;

Hisakazu Sugie, Kyoto, JP;

Toshiyuki Otsuki, Kyoto, JP;

Norimasa Nishida, Kyoto, JP;

Yoshikiyo Hongo, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an analyzer () which includes a placement part () for placing an analysis piece, and a photometric measurer () for photometric measurement of the analysis piece (). In the analyzer (), the placement part () holds the analysis piece () in such a way that a row of reagent pad () on the analysis piece () lie in right-and-left directions (D, D). The photometric measurer () is farther from a front than the placement part (). The analysis piece () placed on the placement part () is conveyed from front toward rear (Direction D), with the row of reagent pads () laid in right-and-left directions (D, D), toward the photometric measurer ().


Find Patent Forward Citations

Loading…