The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Jun. 01, 2011
Osamu Wada, Ina, JP;
Osamu Wada, Ina, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
An eyeball infraduction value Indih is measured, and then ΔE is determined from an equation ΔE=Indih−(Fh+SPh+Nh) based on the eyeball infraduction value Indih, a distance portion eyepoint height Fh, a progressive corridor length SPh, and a reading portion eyepoint height Nh, and Oh is determined from an equation of Oh=Bh−(Fh+SPh+Nh+ΔE+Uh) based on the ΔE, a lens portion height Bh, the distance portion eyepoint height Fh, the progressive corridor length SPh, the reading portion eyepoint height Nh, and a lower frame height Uh. A spectacle lens that satisfies conditions of 0 mm≦ΔE≦2 mm and 0 mm<Oh is selected.