The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2012
Filed:
Dec. 20, 2006
Michael Valasek, Prague, CZ;
Frantisek Petru, Sezimovo Ústí, CZ;
Zbynek Sika, Prague, CZ;
Václav Bauma, Prague, CZ;
Roman Smid, Tabor, CZ;
Michael Valasek, Prague, CZ;
Frantisek Petru, Sezimovo Ústí, CZ;
Zbynek Sika, Prague, CZ;
Václav Bauma, Prague, CZ;
Roman Smid, Tabor, CZ;
Czech Technical University In Prague, Prague, CZ;
INOMECH S.R.O., Tabor, CZ;
Abstract
The invention concerns a method of and apparatus for measurement and/or calibration of the position of an object in space in such embodiment where the apparatus contains at least one moving arm fitted to the frame on one end and on the other end fitted to a platform, where the platform can be attached to the object to be measured or calibrated; during the motion of the object with the platform attached the relative positions of individual members of at least one moving arm, frame and platform are read and the measured data is used for determination of the position of the object or for its calibration. Upon attaching the platform of the measurement and/or calibration apparatus to the measured or calibrated object, these joined parts perform an arbitrary motion within object's operating space actuated by the drives of the object, while the quantities corresponding to relative positions of individual members of the apparatus are collected and used for determination or calibration of position of the object in space. The number of measured quantities during the motion of the platform with the measured or calibrated object is higher than the number of degrees of freedom of the apparatus by at least one.