The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Aug. 21, 2008
Applicants:
Srinath Srinivasa, Bangalore, IN;
Pramod Sakharam Pawar, Bangalore, IN;
Inventors:
Srinath Srinivasa, Bangalore, IN;
Pramod Sakharam Pawar, Bangalore, IN;
Assignee:
Empire Technology Development LLC, Wilmington, DE (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods of detecting distributed attacks that pose a threat affecting more than one node in the network. The distributed attacks include events that appear normal or innocuous when viewed locally at any node. The systems and methods include reference global profiles and detection global profiles corresponding to activities or events of interest on the network.
Srinivasa, Srinath. (2012). Detecting global anomalies (U.S. Patent No. 8296850). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8296850
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile