The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Jul. 29, 2008
Applicants:

Ji-eun Jang, Kyoungki-do, KR;

Seok-cheol Yoon, Kyoungki-do, KR;

Inventors:

Ji-Eun Jang, Kyoungki-do, KR;

Seok-Cheol Yoon, Kyoungki-do, KR;

Assignee:

Hynix Semiconductor Inc., Kyoungki-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor memory device includes an alignment unit configured to align data received from the outside, a plurality of data input/output lines corresponding to the aligned data, respectively and a realignment unit configured to change correspondence between the data and the data input/output lines in response to one or more change signals in a test mode. A method for testing the semiconductor memory device includes inputting data in series using a testing apparatus, aligning the serial data in parallel, and realigning the parallel data in response to one or more change signals.


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