The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Jun. 08, 2007
Venkatramanan Siva Subrahmanian, Potomac, MD (US);
Diego Recupero Reforgiato, Hyattsville, MD (US);
Antonio Picariello, Montefredane, IT;
Bonnie J. Dorr, Laurel, MD (US);
Carmine Cesarano, Somma Vesuviana, IT;
Amelia Sagoff, Bethesda, MD (US);
Venkatramanan Siva Subrahmanian, Potomac, MD (US);
Diego Recupero Reforgiato, Hyattsville, MD (US);
Antonio Picariello, Montefredane, IT;
Bonnie J. Dorr, Laurel, MD (US);
Carmine Cesarano, Somma Vesuviana, IT;
Amelia Sagoff, Bethesda, MD (US);
University of Maryland, College Park, MD (US);
Abstract
System and method for analysis of an opinion expressed in documents on a particular topic computes opinion strength on a continuous numeric scale, or qualitatively. A variety of opinion scoring techniques are plugged in to score opinion expressing words and sentences in documents. These scores are aggregated to measure the opinion intensity of documents. Multilingual opinion analysis is supported by capability to concurrently identify and visualize the opinion intensity expressed in documents in multiple languages. A multi-dimensional representation of the measured opinion intensity is generated which is agreeable with multi-lingual domain.