The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Feb. 25, 2010
Robert Noll, Fairfield, CT (US);
Aaron Turner, Southbury, CT (US);
Alexander Majewski, Fairfield, CT (US);
Robert Noll, Fairfield, CT (US);
Aaron Turner, Southbury, CT (US);
Alexander Majewski, Fairfield, CT (US);
Goodrich Corporation, Charlotte, NC (US);
Abstract
A method is provided that includes receiving and processing a sample signal scan. Processing the sample signal scan includes applying an inner-product operation on the sample signal scan and each of a plurality of eigenvectors to generate a plurality of corresponding coefficients, and subtracting the sample signal scan from a linear combination of the eigenvectors and corresponding coefficients to thereby produce a corrected sample signal scan. In this regard, the eigenvectors have been generated by decomposing a plurality of background reference signal scans according to a singular value decomposition technique. The signal scans include a plurality of electromagnetic signal measurements at a discrete set of frequencies, where each measurement has been taken by a spectrometer system passing an electromagnetic signal through a sample cell including just a base medium (for the background reference signal scans), or both a base medium and a sample medium (for the sample signal scan).