The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Jan. 25, 2006
Michael Mills, Leicester, GB;
Michael Mills, Leicester, GB;
Taylor Hobson Limited, Leicester, GB;
Abstract
A metrological instrument determines a surface profile or form of a surface () of a workpiece () by effecting relative movement between a probe () and the surface () so that the probe follows and is displaced by changes in the surface topography. A measure of the displacement of the probe as it follows the surface is obtained by a displacement provider which may be an interferometric gauge (). Instead of making a measurement along a single measurement path over the surface (), respective measurements are made on sections (andorand) of that measurement path to obtain corresponding measurement data sets and these measurement data sets are independently positioned or aligned to a reference data set. The reference data set may be obtained by a measurement made on another section () of the measurement path (), on another measurement path () over another surface (and) of the component or on another measurement path over a surface on which the component is located. The aligned measurement data sets are then merged together to form a profile of the surface.