The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8296090 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 23, 2012

Filed:

Apr. 02, 2008
Applicants:

Junji Aoki, Kyoto, JP;

Hirokazu Kitaura, Wakayama, JP;

Said Boumsellek, San Diego, CA (US);

Inventors:

Junji Aoki, Kyoto, JP;

Hirokazu Kitaura, Wakayama, JP;

Said Boumsellek, San Diego, CA (US);

Assignee:

Horiba STEC, Co., Ltd., Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 27/00 (2006.01); G01L 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A gas analyzer using a quadrupole mass spectrometric method etc. is provided with an ionizer to ionize a sample gas, a first ion detector and a second ion detector each configured to detect a respective ion from ionizer, and each being disposed a respective distance from the ionizer on an opposite side of the ionizer, the respective distances being different from each other, a filter interposed between the ionizer and the first ion detector to selectively allow ions from the ionizer to pass therethrough, and an arithmetic device to correct a partial pressure of a specific component obtained from the first ion detector and selected by the filter by using a first total pressure of the sample gas obtained from the first ion detector and a second total pressure of the sample gas obtained from the second ion detector.


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