The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Jun. 25, 2009
Kent B. Pfeifer, Los Lunas, NM (US);
William G. Yelton, Sandia Park, NM (US);
Dayle R. Kerr, Sandia Park, NM (US);
Francis A. Bouchier, Albuquerque, NM (US);
Kent B. Pfeifer, Los Lunas, NM (US);
William G. Yelton, Sandia Park, NM (US);
Dayle R. Kerr, Sandia Park, NM (US);
Francis A. Bouchier, Albuquerque, NM (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
A method of multi-dimensional moment analysis for the characterization of signal peaks can be used to optimize the operation of an analytical system. With a two-dimensional Péclet analysis, the quality and signal fidelity of peaks in a two-dimensional experimental space can be analyzed and scored. This method is particularly useful in determining optimum operational parameters for an analytical system which requires the automated analysis of large numbers of analyte data peaks. For example, the method can be used to optimize analytical systems including an ion mobility spectrometer that uses a temperature stepped desorption technique for the detection of explosive mixtures.