The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Oct. 08, 2009
Applicants:

Chung-i Lee, Taipei Hsien, TW;

Chien-fa Yeh, Taipei Hsien, TW;

Wei-qing Xiao, Shenzhen, CN;

Inventors:

Chung-I Lee, Taipei Hsien, TW;

Chien-Fa Yeh, Taipei Hsien, TW;

Wei-Qing Xiao, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing system and method for comparing two monochromic images Aand Bis provided. The system and method thins objects in the monochromic image Bso as to generate a skeleton image B, thickens the objects in the monochromic image Ato generate a bold image A, and overlays the skeleton image Bwith the bold image Aso as to generate an overlaid image AB. The system and method further thins the objects in the monochromic image Aso as to generate a skeleton image A, thickens the objects in the monochromic image Bto generate a bold image B, and overlays the skeleton image Awith the bold image Bso as to generate an overlaid image AB. The system and method outputs the overlaid images ABand ABon a display screen.


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