The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Mar. 14, 2008
Applicants:
Jia Gu, Shenzhen, CN;
Wenjing LI, Fremont, CA (US);
Inventors:
Jia Gu, Shenzhen, CN;
Wenjing Li, Fremont, CA (US);
Assignee:
STI Medical Systems, LLC, La Jolla, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/36 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
Automated image quality assessment methods, which include locating a region of interest, region assessment, contrast assessment, blur assessment, and contaminant detection, on video data and high-resolution imagery. Where the blur assessment is performed without a reference image by dividing the region into non-overlapping block, measuring the wavenumber frequency of the blocks and calculating the ratio of the low frequency to high frequency areas.
Gu, Jia. (2012). Method of image quality assessment to produce standardized imaging data (U.S. Patent No. 8295565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8295565
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile