The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Jun. 30, 2005
Applicants:

Matthew John Naylor, Myrtle Bank, AU;

Matthew Paul Fettke, Morphettville, AU;

Neil Cameron Thatcher, Redwood Park, AU;

Andrew Lennox Davis, Erindale, AU;

Inventors:

Matthew John Naylor, Myrtle Bank, AU;

Matthew Paul Fettke, Morphettville, AU;

Neil Cameron Thatcher, Redwood Park, AU;

Andrew Lennox Davis, Erindale, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus for detecting change of an object state from an initial state where the object is displayed in a plurality of sequential images. The system involves comparing a measure over a predetermined portion of each of the images corresponding to an object's initial state with a reference value of the measure computed when the object is in the initial state to generate a comparison value for each of the images and then generating a signal indicating that the object state has changed when a predetermined number of the comparison values generated for each of the images do not meet a predetermined criterion.


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