The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Jun. 13, 2008
Applicants:

Vaibhav Dinesh, Dehli, IN;

Kunal Raheja, Noida, IN;

Patrick Duvaut, Tinton Falls, NJ (US);

Inventors:

Vaibhav Dinesh, Dehli, IN;

Kunal Raheja, Noida, IN;

Patrick Duvaut, Tinton Falls, NJ (US);

Assignee:

Ikanos Communications, Inc., Fremont, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04M 1/24 (2006.01); H04M 3/08 (2006.01); H04M 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for performing loop analysis are described. Some embodiments are directed to determining loop characteristics such as loop gauge, loop termination, and straight-loop departure. One embodiment includes a method for performing loop length estimation which comprises receiving an un-calibrated echo signal for a loop under test using frequency domain reflectometry single-ended line testing (FDR-SELT), a region associated with the loop under test, and a platform type. The method comprises classifying the loop under test and outputting a loop length estimate based on the classification of the loop under test and based on one of a ripple-period approach and a template-matching approach.


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