The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Dec. 01, 2009
Applicants:

Hyun Kyu Yu, Daejeon, KR;

Mun Yang Park, Daejeon, KR;

Jae Hoon Shim, Daejeon, KR;

Inventors:

Hyun Kyu Yu, Daejeon, KR;

Mun Yang Park, Daejeon, KR;

Jae Hoon Shim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an apparatus and method for In-phase/Quadrature-phase (I/Q) mismatch calibration. The apparatus includes: a symmetrical point extracting part receiving continuous wave signals and extracting an I/Q channel average locus of the continuous wave signals; an error extracting part extracting a degree of distortion of the continuous wave signals from the extracted I/Q channel average locus; and a calibrating part calibrating a mismatch between I-channel signals and Q-channel signals of the continuous wave signals using the degree of distortion of the continuous wave signals.


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