The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

May. 22, 2009
Applicants:

Kenichi Kusaka, Tokyo, JP;

Yoshiharu Saito, Tokyo, JP;

Inventors:

Kenichi Kusaka, Tokyo, JP;

Yoshiharu Saito, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope includes a laser light source, an optical system which changes a beam diameter, and a field stop disposed at a position conjugating with a sample plane, in this order beginning from the side of the laser light source. In this microscopes the following conditional equation is satisfied: A≦D/2 where 'A' is the diameter of the field stop, and 'D' is the diameter of light incident to the field stop.


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