The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Aug. 20, 2010
Applicants:

Ruibo Wang, Mountain House, CA (US);

Ruipeng Sun, Pleasanton, CA (US);

Inventors:

Ruibo Wang, Mountain House, CA (US);

Ruipeng Sun, Pleasanton, CA (US);

Assignee:

Oclaro Technology Limited, Northhamptonshire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 2/00 (2006.01); H04B 10/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A delay line interferometer is configured with a liquid-crystal (LC) tuning element as a phase modulator for demodulating a phase-modulated input signal. The LC tuning element allows for quickly tuning the phase difference between two optical signals separated from the phase-modulated input signal, so that the two optical signals can be coherently recombined to interfere with each other and produce one or more intensity-modulated optical signals. In some embodiments, the LC tuning element is configured to reduce polarization-dependent frequency shift without the use of additional high-precision optical elements and/or coatings.


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