The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Dec. 18, 2008
Applicant:
Ming Lai, Webster, NY (US);
Inventor:
Ming Lai, Webster, NY (US);
Assignee:
Bausch • Lomb Incorporated, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical path delay scanner, comprising a rotatable mount, a first prism and a second prism disposed on the mount, and a radiation source aligned to project light through the first prism and the second prism. The radiation source may be arranged to project the light on a surface of the first prism at an incidence angle corresponding to the prism's minimum deviation angle. The scanner may be disposed in a reference arm of a Michaelson interferometer.