The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Oct. 29, 2008
Knut Siercks, Moerschwil, CH;
Heinz Lippuner, Rebstein, CH;
Ursula Schwitter, Buchs, CH;
Stefan Frei, Widnau, CH;
Baptiste Wusk, Arbon, CH;
Claus P. Keferstein, Werdenberg, CH;
Knut Siercks, Moerschwil, CH;
Heinz Lippuner, Rebstein, CH;
Ursula Schwitter, Buchs, CH;
Stefan Frei, Widnau, CH;
Baptiste Wusk, Arbon, CH;
Claus P. Keferstein, Werdenberg, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
A measuring head system for a coordinate measuring machine, having a scanning element for contacting a measured object as a contacting part, which can be moved such that an object to be measured can be mechanically scanned using the scanning element. An optical sensor is fixed on the measuring head base. Means are provided to generate a projection on the sensor line using at least one radiation source. The means have at least one first mask element to generate a first partial projection on the sensor line such that said partial projection is optimized to determine an x displacement and a y displacement of the contacting part in relation to the measuring head base in the x direction or y direction. An analysis unit is configured to determine the x displacement and the y displacement from signals only generated by the one sensor line.