The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Oct. 09, 2009
Christopher Power, Jena, DE;
Christopher Power, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
The invention relates to a method for imaging a sample using a microscope, in particular a scanning microscope, in which the sample is illuminated with excitation light via an illuminating beam path, and light emitted from the sample is recorded via a detection beam path, wherein at least one adjustable beam splitter having an adjustable threshold wavelength is arranged in the detection beam path or/and in the illuminating beam path, and wherein light emitted from the sample is detected in at least one detection channel. According to the inventive method, for at least one predetermined sample region, a signal intensity of light detected in the at least one detection channel is recorded for a plurality of threshold wavelengths set at the adjustable beam splitter to obtain a signal/threshold-dependency of the predetermined sample region.