The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Aug. 04, 2009
Prajit Kulkarni, San Jose, CA (US);
Prajit Kulkarni, San Jose, CA (US);
Aptina Imaging Corporation, Grand Cayman, KY;
Abstract
This is generally directed to auto-focusing techniques based on statistical blur estimation. An image can be captured at two or more candidate lens positions. The amount of blur of each image can then be determined, and the image containing the least amount of blur can be chosen as the 'in-focus' image. In some embodiments, the amount of blur of an image can be determined by identifying how 'Gaussian' an image is. Characteristics that are more Gaussian in nature can indicate that the image is more blurry. The Gaussianity of an image can be determined by estimating a generalized Gaussian shape parameter for that image. A smaller shape parameter can indicate the image is less Gaussian in nature. The shape parameter can be estimated in any suitable manner such as, for example, through a 2-d discrete wavelet transform, through a 1-d discrete wavelet transform, or through any other suitable manner.