The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Feb. 23, 2010
Applicant:

Gilles Mathieu, Kennedy Town, HK;

Inventor:

Gilles Mathieu, Kennedy Town, HK;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/34 (2006.01); G02B 15/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An extended depth-of-field (EDOF) surveillance imaging system () that has a lens system () with a total lens power φand an amount of spherical aberration SA where 0.2λ≦SA≦2λ. The lens system includes first lens group (G) and a second lens group (G). The first lens group has first and second confronting meniscus lens elements (L, L) that have an overall optical power φsuch that |φ1/φ|≦0.05. The second lens group has a doublet (D) and a most imagewise positive lens element (L). An aperture stop (AS) is arranged either between the first and second lens groups or within the second lens group. An image sensor () is arranged to receive the image and form therefrom a digitized electronic raw image. An image processor receives and digitally filters the digitized electronic raw image to form a digitized contrast-enhanced image.


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