The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Aug. 09, 2010
Applicants:

Yu-chi Chung, Tao Yuan Shien, TW;

Hsin-hung Lee, Tao Yuan Shien, TW;

Hsu-hung Chen, Tao Yuan Shien, TW;

Inventors:

Yu-Chi Chung, Tao Yuan Shien, TW;

Hsin-Hung Lee, Tao Yuan Shien, TW;

Hsu-Hung Chen, Tao Yuan Shien, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides an electronic equipment having a laser component and capability of inspecting leak of laser and an inspecting method for inspecting leak of laser thereof. The electronic equipment according to the invention includes a three-dimensional image-capturing device. According to the invention, the three-dimensional image-capturing device is controlled to capture a two-dimensional image, and to measure an actual depth map. The captured two-dimensional image is processed to obtain an estimated depth map. The invention selectively determines that the laser component occurs leak of laser or malfunctions in accordance with the estimated depth map and the actual depth map.


Find Patent Forward Citations

Loading…