The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Jun. 05, 2007
Applicants:

Daqing Xue, Plainsboro, NJ (US);

Lining Yang, East Windsor, NJ (US);

Inventors:

Daqing Xue, Plainsboro, NJ (US);

Lining Yang, East Windsor, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01); G06T 15/50 (2006.01); G06T 15/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and methods for volume rendering using n-pass sampling are disclosed. A plurality of first rays in a first density is sampled through a volume. Each of the first rays is in a separate section. A value of at least one first ray is compared to a first threshold. A plurality of second rays in a second density is sampled based on the comparison of the at least one first ray. The second rays are in a first section of the separate sections. The first section being for the at least one first ray. A value of at least one second ray is compared to a second threshold. A plurality of third rays is sampled in a second section spatially different than the first section based on the comparison of the at least one second ray. An image rendered from the sampling of at least the first rays is displayed.


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