The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Feb. 25, 2011
Christopher Thomas, San Diego, CA (US);
Yanggao Qiu, Shenzhen, CN;
Junling Zang, Shenzhen, CN;
Wei Fu, San Diego, CA (US);
Christopher Thomas, San Diego, CA (US);
Yanggao Qiu, Shenzhen, CN;
Junling Zang, Shenzhen, CN;
Wei Fu, San Diego, CA (US);
SMSC Holdings S.a.r.l., Luxembourg, LU;
Abstract
Systems and methods are disclosed for improving the accuracy of phase spacing of multiphase clocks. In one example, method includes receiving a reference clock having a first frequency and sampling the reference clock with a plurality of multiphase clocks having a second frequency to generate a plurality of samples. The second frequency is a non-integer multiple of the first frequency. The method also includes detecting transitions of the reference clock occurring between the samples generated from a plurality of pairs of the multiphase clocks and counting the transitions to generate a transition count for each pair of the multiphase clocks. The method also includes summing a set of the transition counts to generate a measured phase for a first multiphase clock, calculating a reference phase for the first multiphase clock, and generating a phase skew value for the first multiphase clock based on the measured phase and the reference phase.