The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

May. 30, 2008
Applicants:

Lucio F. C. Pessoa, Cedar Park, TX (US);

Perry H. Pelley, Iii, Austin, TX (US);

Inventors:

Lucio F. C. Pessoa, Cedar Park, TX (US);

Perry H. Pelley, III, Austin, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing system includes a tester probe and a plurality of integrated circuits. Tests are broadcast to the plurality of integrated circuits using carrierless ultra wideband (UWB) radio frequency (RF). All of the plurality of integrated circuits receive, at the same time, test input signals by way of carrierless UWB RF and all of the plurality of integrated circuits run tests and provide results based on the test input signals. Thus, the plurality of integrated circuits are tested simultaneously which significantly reduces test time. Also the tests are not inhibited by physical contact with the integrated circuits.


Find Patent Forward Citations

Pessoa, Lucio F. C.. (2012). Testing of multiple integrated circuits (U.S. Patent No. 8294483). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8294483

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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