The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Dec. 21, 2005
Applicants:

Moses M. David, Woodbury, MN (US);

Neal A. Rakow, Woodbury, MN (US);

Dora M. Paolucci, St. Paul, MN (US);

John E. Trend, St. Paul, MN (US);

Inventors:

Moses M. David, Woodbury, MN (US);

Neal A. Rakow, Woodbury, MN (US);

Dora M. Paolucci, St. Paul, MN (US);

John E. Trend, St. Paul, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05H 1/24 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Plasma deposited microporous analyte detection layers, method of forming analyte detection layers, and analyte sensors including the same are disclosed. An analyte sensor includes a substrate and a microporous amorphous random covalent network layer. The microporous amorphous random covalent network layer includes silicon, carbon, hydrogen and oxygen with a mean pore size in a range from 0.5 to 10 nanometers and an optical thickness in a range from 0.2 to 2 micrometers.


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